STUDY THE EFFECTS OF CARBON CONCENTRATION ON STRUCTURAL PROPERTIES OF Mn5Ge3 THIN FILMS GROWN ON Ge(111)

Abstract

By combining the results from the structural analysis of Reflection High Enegy Electronic Diffraction, High resolution-transmission electron microscopy (HR-TEM) and X-Ray Diffraction, the maximum concentration of carbon which can be doped into Mn5Ge3 films without changing their structure has been determined to be x= 0.6. Exceeding this concentration, the films structure turns into polycrystalline or amorphous corresponding to carbon concentrations x = 0.7 and 0.9. These change due to the fact that C at these concentrations has exceeded the permissible threshold, leading to excess C destroying the film structure.