Two-Dimensional Model for Simulating Electrical Biasing Effects on Particle Flux

Abstract

A two-dimensional simulation model is developed to verify the effects of electrical biasing on particle transport and its flux to the material. In this model, the flow of electrons and ions is continuously pumped into the system, moving along the magnetic field line to reach the materials. The numerical results show that electrical biasing prevents many electrons and ions from hitting the material, reducing the particle flux attacking this region.